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2. Bugs, bugs, everywhere...!. . Intel Core 2 Duo:50 page Errata75 known bugs IBM PowerPC 750GX:27 page errata13 known bugsAMD Opteron:95 page errata71 known bugs.... including the now infamous quad-core TLB bug.. . . 3. .
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1. 1 Strategies for Post-Silicon Debug of Complex Integrated Circuits and Systems-on-Chip Brad Quinton,
Dept. of Electrical and Computer Engineering,
University of British Columbia
Vancouver, BC
2. 2 IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate… IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate…
3. 3 Bugs, bugs, everywhere...! IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate… IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate…
4. 4 The Culprit: Design Complexity IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate… IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate…
5. 5 The Effect: Costs and Risks ? IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate… IBM Cell, ADM’s Opteron and Fusion, Intel’s Atom and Core 2 Duo…
In fact I am working with a company right now architecting a 65nm SoC, and when you run the numbers you are compelled to integrate…
6. 6 Outline
7. 7 IC Development this increasing complexity is creating many challenges for both verification and validation.this increasing complexity is creating many challenges for both verification and validation.
8. 8 IC Development this increasing complexity is creating many challenges for both verification and validation.this increasing complexity is creating many challenges for both verification and validation.
9. 9 IC Development this increasing complexity is creating many challenges for both verification and validation.this increasing complexity is creating many challenges for both verification and validation.
10. 10 IC Development this increasing complexity is creating many challenges for both verification and validation.this increasing complexity is creating many challenges for both verification and validation.
11. 11 Validation: A High Stakes Game
12. The Need for Post-Silicon Debug
13. 13 “The device won’t boot. Now what?!” Where is the problem: software, hardware, board level….Where is the problem: software, hardware, board level….
14. 14 Visibility is Key
15. Existing Solutions
16. 16 Existing Solutions
17. 17 Existing Solutions
18. 18 On-chip Emulation Trace buffers on internal system busses are a simple example of On-chip EmulationTrace buffers on internal system busses are a simple example of On-chip Emulation
19. 19 Emerging Implementations
20. Our Proposal
21. 21 Our Proposal
22. 22 Reconfigurable DFD analogous to the widespread use of Design for Test (DFT) methodologies, new Design for Debug (DFD) concepts are emerging
embedded reconfigurable => small amount of FPGA logicanalogous to the widespread use of Design for Test (DFT) methodologies, new Design for Debug (DFD) concepts are emerging
embedded reconfigurable => small amount of FPGA logic
23. 23 Reconfigurable DFD analogous to the widespread use of Design for Test (DFT) methodologies, new Design for Debug (DFD) concepts are emerging
embedded reconfigurable => small amount of FPGA logicanalogous to the widespread use of Design for Test (DFT) methodologies, new Design for Debug (DFD) concepts are emerging
embedded reconfigurable => small amount of FPGA logic
24. 24 Framework
25. 25 High-level Architecture
26. 26 High-level Architecture Memory or trace buffer is also integrated in the PLC.Memory or trace buffer is also integrated in the PLC.
27. 27 High-level Architecture
28. 28 High-level Architecture Consider a bug that we encountered on the out first generation product at Teradici. The audio processor had FIFO lock-up problem, but only for one specific (an very rare) packet size. If software knows, it can quickly re-intialize the FIFO, and operation will continue.Consider a bug that we encountered on the out first generation product at Teradici. The audio processor had FIFO lock-up problem, but only for one specific (an very rare) packet size. If software knows, it can quickly re-intialize the FIFO, and operation will continue.
29. 29 Our Proposal - Key Advantages
30. 30 Key Challenges
31. Results
32. 32 Network Topology
We have developed a unique network topology that leverages the programmability of the PLC to reduce network costs:
complete debug node selection flexibility
50% of the area and 50% of the depth previous topologies
hierarchical construction appropriate for ICs
Details:
B.R. Quinton and Steven J.E. Wilton, “Concentrator Access Networks for Programmable Logic Cores on SoCs”, IEEE International Symposium on Circuits and Systems, Kobe, Japan, May 2005.
B.R. Quinton, S.J.E. Wilton, “Post-Silicon Debug Using Programmable Logic Cores”, Proceedings of the IEEE International Conference on Field-Programmable Technology, Singapore, pp. 241-247, December 2005.
33. 33 Network Implementation
We have developed and evaluated two network implementations: synchronous and asynchronous, each achieves high throughput:
synchronous networks up to 830 MHz in 90nm technology
asynchronous networks up to 910 MHz in 90nm technology
reasonable area costs
Details:
B.R. Quinton, M.R. Greenstreet, S.J.E. Wilton, “Practical Asynchronous Interconnect Network Design”, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 16, no. 5, pp. 579-588, May 2008.
34. 34 Programmable Logic Interface
We have developed new programmable structures that are integrated into a regular programmable logic fabric to significantly increase the throughput of interface circuits:
system bus interfaces up to 254 MHz in 180nm
regular synchronous interfaces up to 694 MHz in 180nm
very small area increase in the PLC ( less than 0.4%)
limited impact on the PLC interconnect
Details:
B.R. Quinton, S.J.E. Wilton, "Embedded Programmable Logic Core Enhancements for System Bus Interfaces", Proceedings of the International Conference on Field-Programmable Logic and Applications, Amsterdam, pp. 202-209, August 2007.
B.R. Quinton and Steven J.E. Wilton, “Programmable Logic Core Enhancements for High Speed On-Chip Interfaces”, accepted for publication in IEEE Transactions on VLSI, 2009.
35. 35 Area Overhead
To understand the area overhead of our scheme for a range of ICs we created a set of parameterized models
We used a 90nm standard cell process
We targeted the 90nm IBM/Xilinx PLC with a capacity of approximately 10,000 ASIC gates
The network was implemented using standard cells
All area numbers are post-synthesis, but pre-layout
36. 36 Area Overhead
37. 37 Area Overhead
38. 38 Design for Debug Going Forward
39. 39
How do we select the correct debug nodes?
How do we judge the quality of our debug infrastructure before it is used? What is the “coverage” metric?
How do we integrate hardware DFD with software debug?
How do we integrate DFD with DFT? What is the overlap? Can this reduce costs?
Can we use software algorithms to infer the value of nodes that have not been directly observed?
40. End.