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Mixed-Signal Option for the Teradyne Integra J750 Test System

Mixed-Signal Option for the Teradyne Integra J750 Test System. Group:May08-12 Emily Evers Vincent Tai. Team Leader: Emily Evers Communications Coordinator: Vincent Tai Advisor: Dr. Weber Client: ECpE Department. Requirement Specification. Problem Statement Concept Sketch

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Mixed-Signal Option for the Teradyne Integra J750 Test System

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  1. Mixed-Signal Option for the Teradyne Integra J750 Test System Group:May08-12 Emily Evers Vincent Tai

  2. Team Leader: Emily Evers • Communications Coordinator: Vincent Tai • Advisor: Dr. Weber • Client: ECpE Department

  3. Requirement Specification • Problem Statement • Concept Sketch • System Block Diagram • System Description • User Interface Description • Research • Requirements • Deliverables

  4. Problem Statement The Teradyne system has been updated to allow for analog circuits to be tested. Although the tester is capable of testing analog circuits, there is no easy to use documentation and test procedures for the mixed-signal option.

  5. Daughterboard Socket Converter Teradyne J750 IG-XLSoftware Concept Sketch

  6. Mapping of DIB and Dautgherboard Devices IX-GL Software Documentation Testing System Block Diagram

  7. System Description • Devices • Analog-to-Digital Converters • Digital-to-Analog Converters • High Speed Op Amp • Mapping • Device Interface Board (DIB) • Connects daughter board to tester via pogo pins • Daughter Board • Connects device to DIB

  8. System Description • IX-GL Software • Test Plan • Pin and Channel Map • AC and DC Specs • Timing • Pattern • Testing • Documentation

  9. Users • Electrical and Computer Engineering Faculty • Graduate Students interested in IC testing • Students in EE 418

  10. User Interface Description • IG-XL Software

  11. Market and Literary Research • Previous Groups Work • Previous Cookbooks • Current Documentation of Project Progress • Website • Teradyne Lab Materials • Digital Lab Books • Mixed-Signal Option Lab Books • Teradyne Website

  12. Risks and Risk Management • Risk: New Program maybe hard to learn • Risk Management: Read Teradyne Manuals and Previous • Risk: Limited team members • Risk Management: Time Management

  13. Functional Requirements • The cookbook will be written so that a new user can understand • The testing instructions will cover five different devices • Two Analog-to-Digital converters • Two Digital-to-Analog converters • High Speed Op-amp • Only one device will be tested at a time • A test program will be created for the devices using IG-XL and will allow for easy manipulation for similar devices • Upon successful testing and mating of the devices a cookbook will be made to allow future users to test these devices • The project will be easy to trouble shoot using proper documentation

  14. Non-functional Requirements • The room environment needs to be kept at a consistent temperature of 30°C ± 3° • Electrostatic discharge wrist bands must be worn when using the tester • Access is limited to the lab

  15. Deliverables • DIB and Daughterboard Mapping • Functioning IG-XL code for each device • Completed testing for all devices • Documentation for all devices

  16. Deliverables • Weekly Reports • Website • Project Plan • Design Plan • Final Report

  17. Project Plan • Work Breakdown Structure • Resource Requirements • Project Schedule

  18. Work Breakdown Structure • Review Status • Look over previous groups work • Read Teradyne training manuals • External Mapping • DIB mapping • Daughterboard mapping

  19. Work Breakdown Structure • Create Test Plan • Use IG-XL software • Run Tests Successfully • Write Cookbook

  20. Resource Requirements Time Requirements Financial Requirements

  21. Project Schedule

  22. Thank You • Questions?

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