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Fides and RAMS training Km3Net. S.Colonges APC Quality division. Agenda. Fides training Functional / product level – infrastructure definition Tools HALT/HASS Conclusion. Fides training. -May 2 to 5, 2017 -APC – Paris
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Fides and RAMS trainingKm3Net S.Colonges APC Quality division
Agenda • Fides training • Functional / product level – infrastructure definition • Tools • HALT/HASS • Conclusion
Fides training -May 2 to 5, 2017 -APC – Paris Participants on the workshop (Stephane, Pietro, David, Diego, Luigi, Giuliano, remotely Fabio and Riccardo – also Pietro the last day) Main idea: Stephane support / help designers to perform the FIDES analysis and FMECA. But: in order to be useful designers should be actors! Prepare production, tests and ESS procedures
Fides training Configuration management: Item Data List is mandatory for success (Very important item for KM3NeT) Reference for all the documents. (Also important for KM3NeT) Especial file for Data List -> for each group -Define asap same deliverable for each product -Use same templates for documents
Example of deliverables proposal Product specifications CIDL (Configuration item data list) User manual Technical report Design files ICD: Interface Control Document Manufacturing Test benches Test Reports Records and logbook (Assembly reports) Reliability analysis If available: Public tenders, purchase order, Certificate Of Conformity, Video meeting to continue with the FIDES analysis. Lead free or led -> To be check
Fides training • -Fides presentation (Refers to KM3NET FMECA_reliabilitytraining_2to5may2017 – google doc) • -RAMS tool presentation (developped @APC) and FIDES tool • -Functional analysis: • -Definition of products level • -DOM functional analysis • Goal : describe functions and quantity of each item (the risk is strongly dependant to item quantity) • Practical analysis: • - Compass V1 and V2 analysis (to be completed) – FIT and FMECA • -FMC V2 analysis (FIT and FMECA) • -DOM • -HALT / HASS procedure
Functional analysis Definition Architecture for Functional Analysis: Name - (Example) Level 1: Infrastructure – (KM3NeT) Level 2: Structure - (ARCA-ORCA) Level 3: Equipment – (Link – Onshore- offshore) Level 4: System (offshore: Building block – link: General JB) Level 5: Subsystem (Secondary JB – DU) Level 6: Module (BOB – DOM – DU Base) Level 7: Assembly (Boards: PB, CLB, etc) Level 8: Subassembly (functions – PB rails, etc)
Objectives Our Goal? Reach the highest reliability and safety possible level. Define maintenance and recovery plan Activities name (work package): RAMS: Reliability Availability Maintainability and Safety How? Performing a reliability Engineering Reliability is a continuous improvement (Deming wheel) All the people should be involved : Brainstorming Then the main support tool is FMECA
Priorities • FMC finish • Laser beacon • Power System (Rosanna) • DOM FMECA Update of the DOM • BPS protection version circuit • CLBV3 • WRS
RAMS Tool Define maintenance resources Components BILL of material import Generic components FIDES data / Reliability models data (from Fides analysis) Reliability factors audit Graphical functions display Failures modes analysis Sort components failure rates Tools (for analysis) Failures rates summary / function Functional analysis (input for FMECA and failure rate analysis) Component rating / reliability models selection. Individual FIT display Process factor audit tool Configuration management
INPUTS • Necessary inputs for analysis: • Latest design files (Bill of material and related schematics, drawing, firmware, software, gerbers…) • Design changes tracking: please don’t changes all the reference designators from one version to the other • Technical report and functional analysis • Tests reports (including current, power measurement, thermal analysis when available, EMC…)
Failure rate analysis Failure rate repartition: Bathtub curve shape: -Infant mortality: conception or manufacturing defects -Usefull life / Maturity: Constant/ random failure -Wear out: Failure rate increasing (not for electronic components) Weibull law for mechanic (No normal life : only wear out)
Reliability data • 2 main sources: • Manufacturer data (@ a given environment acceleration law should be applied in order to calculate the value for the product application) • Handbooks (Fides is strongly recommanded for KM3NET) • Define life profile (phase duration and constraints in term of temperature, humidity, vibrating…)
Failure rate data (Fides) FIT data: Failure In Time
APC RAMS Tools -This excel is the main tool for RAMS analysis to collect all data and analyse reliability -Developed by Stéphane Colonges @ APC -Allow to define all functions and assembly levels -Allow to import bill of material -Allow import FIT data (from Fides analysis “Excel_file_fides_result”, manufacturer, field data, or other handbooks) -Audit process tool : to determine Pi Process (impact directly FIT data calculated with Pi Process = 1) -Allow simplifying and accelerate failure rate calculation using reliability models (generic components failure rate data calculated for the application life cycle): Example: Ceramic capacitor 10 µF – 10V for decoupling, rating 50% and not placed in interface could be selected as CAPA_CER_HCV_0,5_Typ2_NIP reliability model -Analyse failure rate / function / assembly / equipment… -FMECA analysis (with automatic failure occurrence and function relation import) -Maintenance table -Tools available in support of Fides analysis
RAMS Tool Components BILL of material import Generic components FIDES data / Reliability models data (from Fides analysis) Graphical functions display Customized results display Sort components failure rates Tools (for analysis) Failures rates summary / function Functional analysis (input for FMECA and failure rate analysis) Component rating / reliability models selection. Individual FIT display Process factor audit tool Configuration management
RAMS Tool Define maintenance resources Reliability factors audit Failures modes analysis
System qualification • Qualification: Check components maximum rating (HALT: Highly Accelerated Life Test) • - Electrical constraints: Voltages, ESD (design/fmeca/procedures), current, breakdown voltage, EMC • Facilities: Signal generators power supply. Oscilloscope, multimeters, test benches • - Environmental and mechanical constraints: • -Temperature, humidity, vibration, shocks, pressure, chemical pollution, salt, radiations (cumulated dose, transcients…), vaccum, UV… • Facilities: Climatic chambers, Hyperbar chamber, vaccum chamber, vibrating bench, colbalt60 source, particle accelerator Salt
ESS HASS: High Accelerated stress screening (youth failure removing) Cause: bad soldering, bounding defect, low component quality… But: Remove or reveal defect due production (bad soldering, bounding defects, low component quality) or conception (too small pad or bad component placement. Component rating margin too short) … Or problem with the manufacturing procedure (example: humidity catch up during board cleaning). Simulate an initial board aging (burnin) and perform thermal constraints (stress screening)
Burnin and ESS Failures Operation (field data) Experiment feedback ESS procedure Production 0 failures Failures 2nd power off/on Switch Voies Séries des 20 UB t° Control box 1rst power off/on 20 boardssupply Climaticchamber control Climaticchamber control PC
Prressure test Pressure chamber: maximum pressure (certified): 400 bar real-time electronic pressure control available: +-5 barpressure rump up/down: from 1 bar/sec up to 20/bar secpressure cycling possible
Actions: Reliability factors Identify reliability improvement factors: • Design: ESD protection, HiRel and critical components, derating, components placement, thermal dissipation, monitoring parameters, environmental protections, ROHS VsWiskers, components obsolescence • Manufacturing: HASS, assembly process, production strategy (batches), visual inspection, manufacturing and functional tests, IPC class, cleanliness, cabling, repairing actions • Quality factors: documentation, configuration management • Failure mode analysis: failure rate analysis, FMECA Output: Reliability level rating impact the failure probability