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ACSES – your partner in analyzing the nanoworld

ACSES – your partner in analyzing the nanoworld. D. S. Karpuzov. ACSES, CME-607, University of Alberta, Edmonton, AB, Canada T6G 2G6. Samples of our recent data. Instruments. What is ACSES. Broad spectra. High-resolution spectra.

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ACSES – your partner in analyzing the nanoworld

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  1. ACSES – your partner in analyzing the nanoworld D. S. Karpuzov ACSES, CME-607, University of Alberta, Edmonton, AB, Canada T6G 2G6 Samples of our recent data Instruments What is ACSES Broad spectra High-resolution spectra ACSES is the acronym for Alberta Centre for Surface Engineering and Science, an interdepartmental facility created jointly by the Faculty of Science and Faculty of Engineering at the University of Alberta • XPS Spectrometer AXIS 165 (Kratos) equipped with ISS, AES, SEM (operational) • XPS Imaging Spectrometer ULTRA (Kratos) with TPD, AES (to be commissioned in December 2003) • ToF SIMS iV (TOFSIMS) (to be commissioned in December 2003) • Universal System (SPECS) with MBE, EELS, LEED and AES (due in December 2003) • JAMP 9500F Auger Microprobe (Jeol) (due in February 2004) • FTIR Spectrometer with controlled environment (in spring 2004) • STM/AFM microscope with environment control (in spring 2004) ACSES Mission Our mission is to provide comprehensive surface analysis of materials for academics as well as R&D and industrial work in Western Canada Techniques Modification of C1s peak of polystyrene and poly-methyl-metacrylateafter treatment in plasma Broad spectrum of NiCo alloy • ACSES is committed to run the following techniques: • Surface analysis: • XPS (X-ray Photoelectron spectroscopy) • XPS imaging • AES (Auger Electron Spectroscopy) • SAM (Auger Electron Microscope) • Static SIMS (Secondary Ion Mass Spectroscopy) • ISS • EELS • LEED • SEM • TPD • Surface FTIR • STM/AFM • Treatment: • High-temperature/gas-pressure adsorption • MBE How to reach us? For contact information and details about the instruments please visit our website www.ualberta.ca/ACSES C-O, C=) and C-C components in C1s spectrum of PET Quantification report for the concentrations of species from the NiCo spectrum above Our Sponsors Angular resolved XPS. From the well resolved peaks of Si-Si and Si-O the oxide thickness can be evaluated Depth profile of composition, MnO2/Pt/Si. 3 keV Ar beam, 45 degr. incidence. Etch rate about 0.4 nm/min

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