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Explore the benefits of ZnO-based UV LEDs grown using vapor cooling condensation. Learn about MgZnO film deposition methods, material characteristics, fabrication processes, and light extraction efficiency factors. The research includes experiments on carrier confinement, optical energy bandgap, and optical properties of thin films.
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ZnO-based thin film double heterostructured-ultraviolet light-emitting diodes grown by vapor cooling condensation technique Po-Ching Wuand Ching-Ting Lee Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, Republic of China.
Outline • Introduction • Experiments • Results and discussion • Conclusions
Introduction • The applications of the UV light: • Anti-counterfeiting detectors • UV treatment • Air and water purification • The advantages of the UV LEDs: • Portable • Safety • Long lifetime • Environmental protection -no mercury (Hg) pollution
The advantages of the ZnO semiconductor: • Wide direct band gap (3.37 eV) • Large exciton binding energy (60 meV) • Low cost, high stability, non-toxic • The energy bandgap of the MgZnO film could be modulated from 3.37eV to 7.7 eV • The common deposition methods of the MgZnO film: • MOCVD [1] • MBE [2] • PLD [3] • Sputtering [4] High-temperature process [3]IEEE J. Sel. Top. Quantum Electron., 14, 1048 (2008). [4] IEEE Photon. Technol. Lett., 20, 2108 (2008). Ref:[1] J. Phys. D: Appl. Phys., 42, 235101 (2009). [2] Appl. Phys. Lett., 86, 192911, (2005).
Characteristics of the ZnO and the MgO materials: [1] Ref:[1] IEEE Photon. Technol. Lett., 20, 2108 (2008).
Lattice structure of the MgZnO films: Mixed Phase • When the Mg content of the MgZnO films is lower than 36%,the lattice structure is still as hexagonal structure.[1] Hexagonal MgZnO Cubic MgZnO Ref:[1] J. Appl. Phys., 94, 7336 (2003).
Experiments The vapor cooling condensation system Deposition layers: i-type MgZnOfilm i-type ZnO film n-type ZnO:In film Deposition conditions: Pressure :10-4 torr Deposition Rate :1 Å/s Substrate Temperature:80K
Fabrication process of the ZnO-based thin film double heterostructured-ultraviolet light-emitting diodes (UV LEDs) • ULEDs was patterned by the conventional photolithography andlift-off process. • The electrodes were deposited by the electron-beam evaporator. • The ohmic contacts of the Ni/Au metals and p-AlGaN was processed with sulfide treatment and performed at 500oC in an air ambient for 10 min in the rapid thermal annealing (RTA) system, while the Ti/Au metals and n-ZnO:In:In was performed at 200oC in a N2 ambient for 3 min. • The p-AlGaN/i-MgZnO/i-ZnO/i-MgZnO/n-ZnO:In UV LEDs and the conventional p-AlGaN/i-ZnO/n-ZnO:In UV LEDs were fabricated.
The schematic diagram of the p-AlGaN/i-MgZnO/i-ZnO/i-MgZnO/n-ZnO:In UV LEDs MgZnO ZnO MgZnO CB A energy level schematic diagram of the MgZnO/ZnO/MgZnO double heterostructure • Carrier confinement • Enhance the radiative recombination rate VB
The influence factor of the light-extraction efficiency of the LEDs:[1] n1 > n2 • Critical angle loss • (internal total reflection) • Snell`s law • n1sinc = n2 sin90 • c =sin-1(n2 / n1) T n2 n2 • Fresnel loss • T+R=1 • R=(n2-n1)2/ (n2+n1)2 • T=1-R=4 n2n1/ (n22+2n2n1 + n12) n1 n1 R c Reduce the light extraction loss Ref:[1] S. M. Sze, Semiconductor Devices: Physics and Technology. New York:Wiley, 2002.
The schematic cross sectional view of the UV LEDs • Deposited the transparentoxide films of the SiO2and TiO2, respectively, on the top and sidewall of the UV LEDs by using aRF sputtering system. • The contribution of the oxide passivation layer : • reduce the light extraction loss • reduce the leakage current Refractive index: n(air) = 1 n(SiO2) = 1.45 n(ZnO) = 2 n(TiO2) = 2.3
Results and discussion The properties of the p-type AlGaN • The energy band gap of the p-type Al0.18Ga0.82Nlayer was about 3.71 eV. • Activation:750 °C in N2 ambient for 30 min • Hole concentration = 3.0 × 1017 cm-3 , Hole mobility =3.86 cm2/V-s Hall measurement results of the films deposited by the vapor cooling condensation system
Transmittance and optical energy bandgap Tauc plot [1] visible region d:Thickness :Absorption coefficient T : Transmittance h:Planck`s constant :Photon frequency Eg:Optical energy bandgap Ref:[1] Phys. Stat. Sol., 15,627 (1966).
EDS measurement XRD measurement • The magneisum content of the MgZnO film was about 25%.[1] • The (0 0 2) diffraction peak of the hexagonal structurein the MgZnO film was measured. [2] Ref:[1] J. Appl. Phys., 101, 033502 (2007). [2] Thin Solid Films, 372, 173 (2000).
Photoluminescence spectra Near-band edge (NBE) emission • The photoluminescence spectra was excited by a He–Cd laser with a wavelength of 325 nm. • The NBE emission peak of the i-type ZnO film at 380 nm was observed. • Defect emission at the visible region was small enough.
Why the films deposited at low-temperature have lower defect concentration? Room temperature photoluminescence spectra of the high temperature (HT)-ZnO films and the low temperature (LT)-ZnO films excited with a He–Cd laser with a wavelength of 325 nm. [1] Ref:[1] H. Y. Lee, S. D. Xia, W. P. Zhang, L. R. Lou, J. T. Yan, and C. T. Lee, “Mechanisms of high quality i-ZnO thin films deposition at low temperature by vapor cooling condensation technique,” J. Appl. Phys., 108, 073119 (2010).
Current-Voltage measurement • A typical rectifying behavior was clearly observed by the semiconductor parameter analyzer. . • The forward turn-on voltage and the reverse breakdown voltage were about 3.25 V and-9.4 V,respectively.
Electroluminescence spectra • The emission peaks were at 380 nm. • Only a pure UV emission was observed, without defect emission at the visible region. • EL peak intensity and total emission power of double heterostructured-UV LEDs were much higher, about 3.08 and 1.82 times. 380 nm visible region
Conclusions • High quality ZnO and MgZnO film with low defect concentration were successfully deposited by the vapor cooling condensation system. • The UV LEDs with a pure UV emission and without defect emission at the visible region was achieved. • Double heterostructure was contributed to the carrier confinement and the enhancement of the radiative recombination rate in the active i-ZnO layer. • The EL emission peak intensity and the total emission power of the double heterostructured-UV LEDs were much higher than that conventional UV LEDs.