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FIELDBUS : WorldFIP RadHard Developments. Julien Palluel BE/CO/FE. Summary. WorldFIP Description and principle LHC problematic RadHard Solutions Protection systems Re-initialisation systems Choice of components Radiation tests : repeater Co/Co example Gammas radiations Protons tests.
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FIELDBUS :WorldFIP RadHard Developments Julien Palluel BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Summary • WorldFIP • Description and principle • LHC problematic • RadHard Solutions • Protection systems • Re-initialisation systems • Choice of components • Radiation tests :repeater Co/Co example • Gammas radiations • Protons tests Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
WorldFIP Description Maximum length of wiring 8000m with a speed of 31.25Kb/s 1000m with a speed of 1Mb/s 500m with a speed of 2.5Mb/s 300 km of WorldFIP fieldbus Consequences Repeaters RadHard Diagnostic Agent Rad-Hard (FIPDiag) Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
WorldFIP • LHC problematic • All elements must be RadHard • Protection against latch-up • Protection against single event • Lifetime under radiation : >200 Gy • Components high life • Durability of the radiation tested cards Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
RadHard Solutions • Protection against latch-up Powercycle System • Example : Repeater RadHard Protection system : cut the power line with a MOS power for 1 second after the detection of an overcurrent (ex threshold 4xInom) Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Principle of protection against latch-up: Schema of protection against latch-up: RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Protection against latch-up Component reference Cut-off element : MOS-FET OD 22-16V Current measure : LMV 393 Cut-off timer : CMOS 74HC4538 RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Protection against Single Event module Re-initialisation Example : Repeater RadHard Protection system : inactivity of one of the two mediums, detected by the component FIELDRIVE generates a reset signal which is processed by an integrated function in the FPGA. RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Protection against Single EventUp-set: Corruption of memory (address, configuration…) Example : FIPDiag module re-initialisation of the software by a remote reset triggered by a specific message (255 characters) RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
RadHard Solutions • Lifetime under radiation selection of components not sensitive to radiation …) • Example : Galvanic isolation provided by the transformer in place of optocoupler Repeater RadHard A 5V supply is obtained from 230V sector. The regulation is linear (type regulator Balasta) with transformer and diode bridge. Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Principle of power supply: Schema of power supply : RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Lifetime under radiation selection of components not sensitive to radiation Example : Repeater RadHard Repetition process embedded in a type ACTEL FPGA anti-Fuse resistant to radiation (Ref : Actel eX128 TQ100) CMOS components WorldFIP technology tested in 1998 (FIELDRIVE) RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Lifetime under radiation Repeater RadHard WorldFIP technology tested in 1998 (TCC2, mixed fields) Référence composant : SSSB222 FIELDRIVE 0421A FIELDTRx.S JMF 9539 04/47 Currently these two components have evolved to a new technology that seems to be more sensitive to radiation. Tests are planned at CNGS RadHard Solutions ! Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Components turnover Period of production too short Solution Use virtual device defined in VHDL and integrated in FPGA already tested Example : In-sourcing WorldFIP technology Purchase technology WorldFIP VHDL Adaptation to CERN needs Realisation Project under the responsibility of Javier Serrano’s team RadHard Solutions Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation TESTS : Repeater Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation TESTS : Repeater • General architecture of the card : Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation TESTS : Repeater • Gammas radiations tests at Pagure’s CEA, Saclay • Conditions of irradiation • Cobalt-60 source • Total Irradiation of the card (active part) • Dose and period: • 1h30 at 20Gy/h (2.60m from the source) • 5h at 60Gy/h (1.51m from the source) • FIP Speed : 1MB/s. • MacroCycle period : 100ms • Variables : 2 (1xRead + 1xWrite on FIPDIAG) Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation TESTS : Repeater • Gammas radiations tests at Pagure’s CEA, Saclay • Results : • 1) 20Gy/h irradiation No functionnal fault (Up-set, Latch-up and Reset) • The overall current of the module remained constant at 147mA • Test of the anti-latch-up was working well • 2) 60Gy/h irradiation No functionnal fault (Up-set, Latch-up and Reset) until 310Gy up where the module has stopped working. • Remarks : • The overall current of the module has increased from 147mA to 152mA, then 147mA just before stop working. • We have made some power reset until the end of this test. The repeater stayed silent • Once testing is completed, after 5 minutes of rest, the module was working normally. Possible reason : the supply current has drained the trapped charges in MOS thresholds and allowed them to re-operate properly. In the LHC where the modules will experience a much lower fluence, it should therefore not have any operational defect related to gamma radiation. Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Protons tests at Louvain,Belgium Conditions of irradiation Proton beam 62 Mev Flux between 5x10exp7 and 5x10exp8 P/cm2/s Total Irradiation of the card (active part) Speed : 2.5MB/s MacroCycle period : 20ms Variables : 2 (1xRead + 1xWrite on FIPDIAG) Radiation TESTS : Repeater Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation TESTS : Repeater Julien PALLUEL BE/CO/FE Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009 20
Radiation TESTS : Repeater • Protons tests at Louvain,Belgium • Results • 235gy (1 Up-Set seen) on first repeater • 512gy (2 Up-Sets seen) on second repeater before first faults • Overall current mainly constant • Test of the anti-latch-up was working well Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
References • Main repository • www.cern.ch/cern-worldfip • Repeater Rad Hard • www.cern.ch/cern-worldfip/Docs/CERN Presentations/Radiation Hard Repeater-ENG.pdf • http://documents.cern.ch//archive/electronic/cern/others/ab/ab-note-2005-039.pdf • www.cern.ch/cern-worldfip/Docs/Hardware Modules/Repeater CU-CU Radiation Hard/Manuel Repeteur Cu_Cu-FR.pdf • FIPDiag • www.cern.ch/cern-worldfip/Docs/CERN Presentations/Fipdiag and FipADUC Modules-ENG.pdf Radiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 2009
Radiation Répéteur FPGA Proton Gamma WorldFIP Latch-up Upset Dose KEYWORDS