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EE 5340 Semiconductor Device Theory Lecture 29 - Fall 2009. Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc.
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EE 5340Semiconductor Device TheoryLecture 29 - Fall 2009 Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc
Mark E. Law, E. Solley, M. Liang, and Dorothea E. Burk, “Self-Consistent Model of Minority-Carrier Lifetime, Diffusion Length, and Mobility, IEEE ELECTRON DEVICE LETTERS, VOL. 12, NO. 8, AUGUST 1991. • A best-fit model is reported for tmin data from others for both acceptor doped and donor doped Si. • Combined their tmin data with the Lmin data reported by others and the diffusion coefficient model of Arora, et al. [IEEE Trans ED, ED-29, 1982, p. 292, ff] to fit a model for