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AIDA WP8.4 INFN contribution and planning. Mauro Citterio on behalf of INFN Milano INFN Perugia INFN Pisa. INFN – Perugia in 8.4. Activities: - Radiation modelling of Silicon detector devices (ISE-TCAD) and correspondence with irradiated samples.
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AIDA WP8.4 INFN contribution and planning Mauro Citterio on behalf of INFN Milano INFN Perugia INFN Pisa Mauro Citterio - AIDA Kick-off Meeting: WP8.4
INFN – Perugia in 8.4 • Activities: • - Radiation modelling of Silicon detector devices (ISE-TCAD) and correspondence with irradiated samples. • - Model development of irradiated silicon detector response. • - Characterization of Silicon strips detector. • - Contribute to the definition of specification and testing procedures Mauro Citterio - AIDA Kick-off Meeting: WP8.4
INFN – Pisa in 8.4 • Equipment and experience • Clean room in Pisa • Equipment of various kind • Metrological • Coordinate measurement machines • Thermohydraulic measurements • Strain gauges • Experience with materials • Composite materials • Glues • Carbon fiber, etc. Mauro Citterio - AIDA Kick-off Meeting: WP8.4
INFN – Pisa in 8.4 • Activities: • Review material qualification in particular for • Structural Glues • Carbon fiber based materials • Contribute to the definition of specification and testing procedures • Conduct testing of identified materials and components • In particular measure thermo-mechanical properties Mauro Citterio - AIDA Kick-off Meeting: WP8.4
Beam line Device under test INFN – Milano in 8.4 • Radiation tests of electronics components (TID, DD, SEU) • Equipment and experience • Electronics Equipments for • analog and digital testing of devices and complex circuits • testat cryogenic temperatures • test with high magnetic fields • Characterization of components before and after irradiation • Burn-in/Aging test apparatus • Experience of radiation testing of various components • ASICs, COTs, Programmable Logic, Transistors • Board level/Equipments/Power Supplies Beam line Device under test Mauro Citterio - AIDA Kick-off Meeting: WP8.4
INFN -Milano in 8.4 • Review existing data on “rad-tolerant” electronics componentsand experience from LHC • Reports form CMS/ATLAS/LHCb/ALICE • .... RD49 ... • Literature survey ... with some guidelines from “users” • IEEE NSREC Data Workshop and Proceedings • RADECS Data Workshop and Proceedings • ESA Contract Reports. • ESA Radiation Design Handbook. PSS 609 • IEEE Publications. • CERN reports and publications Mauro Citterio - AIDA Kick-off Meeting: WP8.4
INFN -Milano in 8.4 • Critical Review of Radiation Testing Specifications and Standards • Total Ionizing Dose: • SCC 22900 (ESA SCC) SCC-ESA- • Mil Std 883E Method 1019.6 (DESC) • ASTM F1892 (includes ELDRS) • ….. • Single Event: • SCC 29500 (ESA SCC) SCC-ESA- • EIA/JEDEC Standard EIA/JESD57 • ASTM F1192 • ……. Mauro Citterio - AIDA Kick-off Meeting: WP8.4
Some examples .... Dose-rates for testing. - High Dose Rate: SCC 22900 Window 1. 1-10 rads/sec. MIL883E 1019.6. 50-300 rads/sec. - Low Dose Rate: SCC 22900 Window 2. 0.01-0.1 rads/sec. MIL883E 1019.6. 0.01 rads/sec. Elevated Temp. 0.5-5 rads/sec. Sample Size/Traceability Sample Size: Total Ionizing Dose. Minimum 5 samples. 4 test, 1 reference. Single Event. 3 samples recommended. Traceability Use single Lot Date Code for test to avoid “Safety Factors” Mauro Citterio - AIDA Kick-off Meeting: WP8.4
Goal: Definition of a test procedures and perform tests on selected components • Input: predicted radiation spectra/doses for the various experimental “region” Mauro Citterio - AIDA Kick-off Meeting: WP8.4
What type of test .... ATLAS Liquid Argon Electronics: The major background is due to neutrons and gammas. On the right is a simulated spectrum of particles, from Mike Shupe (U Arizona) made in ca. 2000. Mauro Citterio - AIDA Kick-off Meeting: WP8.4
What types of effects to be tested • Some Examples for Single Event Effects • Latch up. Permanent, potentially destructive • Bit flips ( Single Event Upset ) in bi-stables (‘Upset’) • High Anomalous Current (HAC), snap back • Heavy Ion Induced Burn out in power MOS • Single Event Gate Rupture (SEGR) • Single Event Transient, noise pulses, false outputs • Soft Latch (device or system lock-up) • Typical Single Event Transient Requirements. • Output voltage swing of rail voltage to ground and ground to rail voltage. • Duration: 15 microseconds for Op Amps. • 10 microseconds for comparators, voltage regulators and voltage references. • 100 nanoseconds for opto couplers. Mauro Citterio - AIDA Kick-off Meeting: WP8.4
How to test .... • Test Software (Single Event) • Test pattern dependence. All 1, All 0, Alternate 1 0, Chequerboard • Different sensitivities for different registers. • Dead Time. (detect flip/record/rewrite) • How to test Processors ( Golden Chip ?) • Possibility to run application software ? • Mitigation in FPGA … • Define/agree a realistic test programme, we cannot test every material and component! • We have a little more than a year to knock at “user” doors .... • D8.4.1 Experience at LHC and definition of test programme Month 12 • M8.4.1 8.4 Definition of test procedure and specifications Month 18, Activity report Mauro Citterio - AIDA Kick-off Meeting: WP8.4
Production Database.... • Most of the detectors in Atlas has a Production Database • It should be used as a starting point • It contains various information (datasheet, drawings, test results, links …) Mauro Citterio - AIDA Kick-off Meeting: WP8.4
Production Database.... There are already available databases: – NASA-GSFC: http://radhome.gsfc.nasa.gov – NASA-JPL: http://radnet.jpl.nasa.gov – ESA: http://escies.org – DTRA ERRIC: http://erric.dasiac.com – NRL REDEX: http://redex.nrl.navy.mil • Set-up a WEB database that will compile the information useful for the “AIDA user”is the “dream”: • - Friendly user interface to the database • - Full of input from the users • - Good public visibility of the results Mauro Citterio - AIDA Kick-off Meeting: WP8.4