IC-EMC a Demonstration Freeware for Predicting Electromagnetic Compatibility of Integrated Circuits

1. Asia-Pacific EMC-Week in Singapore, May 2008 IC-EMC a Demonstration Freeware for Predicting Electromagnetic Compatibility of Integrated Circuits Alexandre BOYER, Etienne SICARD alexandre.boyer@insa-toulouse.fr http://www.ic-emc.org

2. Credits • European project MEDEA+ “Parachute” (2005-2007) • European project PIDEA+ “EMCPack” (2006-2008) • National project EPEA (2007 – 2010)

3. Summary 1. EMC of IC issues 2. What is IC-EMC 3. IBIS interface 4. Emission Prediction 5. Near Field Prediction 6. Susceptibility Prediction 7. Conclusion

4. Tools Training Design Guidelines 1. EMC of IC Issues EMC validated before fabrication IC-EMC DESIGN Architectural Design Design Entry Design Architect EMC Simulations Compliance ? FABRICATION NO GO EMC compliant GO

5. 2. What is IC-EMC Why is it free? • Developed within projects like MEDEA+ “Parachute” (2005-2007), PIDEA+ EMCPack (2006-2008), EPEA (2007-2010) • Promotes and defends the “European” vision of EMC of ICs • Trainings in industry and university Why is it non-confidential? • Standard-based tool : IBIS (IEC 62014-1), ICEM (IEC 62014-3), ICIM (IEC 62433-4), • Integrated Circuit parameters & models from ITRS roadmap • Demonstrator for industrial

6. 2. What is IC-EMC A demonstrator for predicting EMC of integrated circuits • A simple tool dedicated to predict EMC of ICs • An electric circuit schematic editor • An interface to WinSpice analog simulator • A set of post-processing tools • A library of EMC/IC elements • A set of EMC-related goodies

7. Post-processing tools Spice Simulation Near-field simulation Impedance simulation Main analysis Spectrum analysis Immunity simulation IBIS interface 2. What is IC-EMC Electric circuit schematic editor IC, package and PCB model Basic symbols

8. I/O model display IBIS file editor Package viewer 3. IBIS Interface I/O Buffer Information Specification file editor Very important for : • I/O emission prediction • I/O immunity prediction

9. R, L, C extraction 3. IBIS Interface Package parasitic evaluation

10. Near-field emission Conducted emission 1/150  Radiated emission GTEM 4. Emission Prediction Target measurement methods (IEC 61967) • Predict conducted mode, radiated and near-field emission • Non-confidential and based on standards (ICEM model – IEC 62433-2) • Targeted range : 1 MHz – 10 GHz • Mature handling of emission prediction in IC-EMC

11. 4. Emission Prediction Emission spectrum prediction Simulation Measurements Core Model Package Model Probe Model Test board Model Frequency measurements Time-domain measure Analog Time Domain Simulation Fourier Transform Fourier Transform Compare dBµV vs. Frequency

12. dBµV • Emission spectrum measurement simulation MHz 4. Emission Prediction Emission spectrum analysis ICEM model

13. IBIS IC size Pin location Measurements Lead inductances Electrical schematic Near field scan at a given frequency and altitude R,L,C Tuning Fourier Transform of I(t) IC-EMC H[x,y,z] of I(f) Scan Measurement/Simulation 5. Near-field Prediction LeadPlacement PackageRLC Core noiseModel (ICEM) Time domain Simulation WinSPICE

14. Measurement Simulation 16 bit microcontroller -15.2 -16.1 -8.2 -8.6 -9.3 -8.1 5. Near-field Prediction ICEM model

15. 6. Susceptibility Prediction Target measurement methods (IEC 62132) Radiated immunity in GTEM Direct Power Injection Near-field Immunity • Only for harmonic disturbances, not for transient immunity • Predict conducted, radiated mode and near-field susceptibility • Non-confidential and based on standards (IBIS, ICIM) • Targeted range : 1 MHz – 10 GHz

16. Aggressed IC Model (ICEM) Package and IO model (IBIS) RFI and coupling path model (Z(f)) Set RFI frequency IC-EMC Increase V aggressor WinSPICE Increase RFI frequency Time domain simulation Susceptibility threshold simulation Criterion analysis IC-EMC Extract forward power 6. Susceptibility Prediction Susceptibility simulation flow

17. DPI on IO model 16 bit microcontroller simulation measurement Susceptibility threshold simulation 6. Susceptibility Prediction

18. 7. Conclusion • An environment for EMC prediction at IC level and trainings has been developed • The tool is free and is based on standard • Conducted and radiated emission successfully predicted on several ICs • Conducted susceptibility successfully predicted on several ICs • Positive feedback from trainees concerning the tool usage for the illustration of EMC concepts (80 – 90 % satisfaction rate) • The demonstration tool and manual are online at www.ic-emc.org

19. Publications • E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11 , September-November 2005, Pages 1277-1284 • S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, Dec. 2005, 0-387-26600-3 • E. Sicard, G. Peres "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits", proceedings of EMC Compo 05, Munich, Nov. 28-30, 2005 • E. Sicard, "IC-EMC, a software for analysing EMC of integrated circuits", 2005 IEEE EMC Symposium, 8-12 Aug @ Navy Pier in Chicago, Computer demonstration session. • A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor Susceptibility to Near-Field Aggression”, proceedings of the IEEE International Symposium on EMC, Hawaii, Jul 2007. • A. Boyer, M. Fer, L. courau, E. Sicard, “Modeling of the Susceptibility of 90 nm Input Output Buffer”, Asia Pacific EMC Week in Singapore, May 2008