Radiation Effects on the Aeroflex RadHard Eclipse FPGA

1. Radiation Effects on the Aeroflex RadHard Eclipse FPGA Ronald Lake Aeroflex Colorado Springs Lake

2. RadHard Eclipse Radiation Effects Overview • Test Techniques • Single Event Effects Results • Single Event Upset • Single Event Latch-up • Total Ionizing Dose • DC Characteristics • AC Characteristics • TMR Effects on SEU • Summary Lake

3. Hardness Testing Conditions - SEE • SEU - 25oC, 2.25V core and 3.0V I/O, in accordance with EIA/JESD57 • SEU - FPGA programmed (configured) with three data storage components • Dynamic Shift Registers - Two at 560 bits • Static Register File - 64 x 16 bits • Static RAM - 55,296 bits • SEL - 125oC, 2.7V core and 3.6V I/O, in accordance with EIA/JESD57 • 208-lead ceramic quad flat-pack (CQFP) Lake

4. Hardness Testing Conditions - SEU • Alternating ones and zeros data used for all three storage components of the FPGA • National Instruments tester at 1MHz frequency • Write/read shift register • Read only register file and RAM • After a cell upsets, the correct data is re-written to the cell • Texas A&M University Cyclotron Institute • Au, Kr, and Ar from 0o (normal incidence) to 60o Lake

5. Heavy Ion Beam For SEU Analysis Lake

6. Hardness Testing Conditions - SEL • Devices statically biased during irradiation • Supply currents monitored for latch-up • Lawrence Berkeley National Laboratory • Au at 41o • Effective fluence at 1E7 ions/cm2 • Effective LET = 120 MeV-cm2/mg • Devices functionally re-verified after irradiation Lake

7. Heavy Ion Chamber for SEL Analysis Lake

8. Hardness Testing Conditions - TID • Irradiated under worst case temperature (25oC) and static bias conditions (max VDD) per MIL-STD-883E Method 1019 • FPGA programmed with 60 AC paths • J.L. Shepherd model 81-22 Cobalt 60 gamma cell Lake

9. Cobalt 60 Total Ionizing Dose System Lake

10. Single Event Upset Data Plot Lake

11. Hardness Results - SEE SEU - Error-rates - GEO orbit, Adam’s 90% WC SEL - No latch-up to 120 MeV-cm2/mg TID - 113 rads(Si)/s FPGA meets datasheet ACs and DCs post 300 krad(Si) Lake

12. Hardness Results - TID - Supply Current DCs Most Shifted DCs - Post radiation minus Pre-rad Lake

13. Hardness Results - 100 krad(Si) TID - ACs 5 most shifted ACs on each of 2 devices Post 100 krad(Si) minus Pre irradiation Lake

14. Hardness Results - 300 krad(Si) TID - ACs 5 most shifted ACs on 2 devices Post 300 krad(Si) minus Pre irradiation Lake

15. RadHard Eclipse Single Voter TMR Lake

16. RadHard Eclipse Single Voter Data Error-rates based on SpaceRadiation 4.0 Weibull analysis, Geo orbit, Adam’s 90% WC environment * Estimate based on assumed onset LET of 100 and saturated x-section of 7E-9 Lake

17. RadHard Eclipse Single Voter Data 8/17/4 TMR2 Data : TAMU Lake

18. Summary • Completed RadHard Eclipse FPGA pre-qualification evaluation of radiation performance • Low Single Event Upset error rate (geosynchronous orbit, Adams 90% worst case environment) • Single Event Latch-up immune to > 108 MeV-cm2/mg • Passes datasheet parameters to > 300 krad(Si) Total Ionizing Dose • TMR design maps well to logic cell architecture • Offered as a flight qualified QML Q & V RadHard Standard Microcircuit Drawing device Lake