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Explore the latest developments in photovoltaic materials testing and standards with a focus on analytical methods, metrology, and inspection. Stay updated on industry standards and upcoming meetings in the PV materials field.
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NA Photovoltaic Materials TC Chapter Liaison Report Updated Nov 9, 2015
Co-chairs John Valley (Sun Edison) Lori Nye Hugh Gotts (Air Liquide) NA PV Materials TC Chapter Liaison
NA Photovoltaic Materials TC Chapter C: Lori Nye – Brewer Science C: John Valley – Sun Edison C: Hugh Gotts – Air Liquide Int’l PV Analytical Test Methods, Metrology, and Inspection TF • Hugh Gotts – Air Liquide Electronics US • Chris Moore – BayTech Resor • Ron Sinton – Sinton Instruments NA PV Materials TC Chapter Liaison
Meeting Information • Last meeting • NA Fall Standards Meeting • SEMI HQ, San Jose CA • Wednesday, Nov 4, 2015 • Next meeting • NA Spring Standards Meeting • SEMI HQ, San Jose CA • Wednesday, April 6, 2016 • Check www.semi.org/standards for the latest update NA PV Materials TC Chapter Liaison
New SNARFs • Reapprovals of • SEMI PV25-1011 Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry • SEMI PV21-1011 Guide for Silane (SiH4), Used in Photovoltaic Applications • SEMI PV24-1011 Guide for Ammonia (NH3) in Cylinders, Used in Photovoltaic Applications • SEMI PV26-1011 Guide for Hydrogen Selenide (H2Se) in Cylinders, Used in Photovoltaic Applications • Doc. 5902A, Line Item Revision of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry (SNARF was revised) NA PV Materials TC Chapter Liaison
SNARF 3 year status • All SNARFs were abolished due to lack of interest • 5435 Auxiliary Information: Interlaboratory study for SEMI PV25-1011, Test Method for Simultaneously Measuring Oxygen, Carbon, Boron and Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry • 5503 Auxiliary Document: Round Robin (Multi-laboratory Test) of SEMI PV9-1110 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurement of Microwave Reflectance After a Short Illumination Pulse • 5501 Auxiliary Document: Interlaboratory Study for PV43-0113 - Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method • 5567 Auxiliary Document: Interlaboratory Study for PV49, Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry NA PV Materials TC Chapter Liaison
Ballots Results [1] • Ballots passed • Doc. 5802B, New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by Laser Triangulation Sensors • Doc. 5803B, New Standard: Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Laser Triangulation Sensors NA PV Materials TC Chapter Liaison
Ballots Results [2] • Ballots passed • Doc. 5895, Line Item Revision of SEMI PV16-0611 Specification for Nitric Acid, Used in Photovoltaic Applications • Doc. 5896, Line Item Revision to SEMI PV20-1011 Specification for Hydrochloric Acid, Used in Photovoltaic Applications • Doc. 5897, Line Item Revision to SEMI PV27-1011 Specification for Ammonium Hydroxide, Used in Photovoltaic Applications • Doc. 5898, Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge • Doc. 5899, Line Item Revision to SEMI PV30-0212 Specification for 2-Propanol, Used in Photovoltaic Applications NA PV Materials TC Chapter Liaison
Ballots Results [3] • Ballots passed • Doc. 5900, Line Item Revision to SEMI PV33-0212 Specification for Sulfuric Acid, Used in Photovoltaic Applications • Doc. 5901, Line Item Revision to SEMI PV36-0912 Specification for Hydrogen Peroxide, Used in Photovoltaic Applications • Doc. 5904, Reapproval of SEMI PV14-0211 Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications • Doc. 5905, Reapproval of SEMI PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials • Doc. 5903, Reapproval of SEMI PV9-0611 Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse NA PV Materials TC Chapter Liaison
Ballots approved for next meetings • Reapprovals of • SEMI PV25-1011 Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry • SEMI PV21-1011 Guide for Silane (SiH4), Used in Photovoltaic Applications • SEMI PV24-1011 Guide for Ammonia (NH3) in Cylinders, Used in Photovoltaic Applications • SEMI PV26-1011 Guide for Hydrogen Selenide (H2Se) in Cylinders, Used in Photovoltaic Applications • Doc. 5902A, Line Item Revision of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry • Doc. 5894, Line Item Revision to SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon NA PV Materials TC Chapter Liaison
Int’l PV Analytical Test Methods, Metrology, and Inspection TF • Drafting • Doc. 5801: New Standard: Guide for the Planning, Implementing and Analyzing data from a Round Robin used to verify a Test Method • Doc. 5902A, Line Item Revision of SEMI PV1-0211 Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry NA PV Materials TC Chapter Liaison
Questions? • Contact Kevin Nguyen at knguyen@semi.org NA PV Materials TC Chapter Liaison