Towards III-V MOSFET
Contact Resistance Modeling and Analysis of HEMT Devices S. H. Park, H.-H. Park, M. Salmani-Jelodar, S. Steiger, M. Povolotsky, T. Kubis, G. Klimeck Network for Computational Nanotechnology (NCN), Purdue University. Virtual Source. E F. 0 nm. E F. E F. 2D simulation domain. E F.
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