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Rich Katz, Grunt Engineer NASA Office of Logic Design

Briefing: Independent NASA Test of RTSX-SU FPGAs SEE Evaluation. Rich Katz, Grunt Engineer NASA Office of Logic Design. Unprogrammed Antifuse Reliability. Unprogrammed antifuses (millions/device) must remain high impedance Potential Failure Mechanisms Time Dependent Dielectric Breakdown

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Rich Katz, Grunt Engineer NASA Office of Logic Design

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  1. Briefing: Independent NASA Test of RTSX-SU FPGAsSEE Evaluation Rich Katz, Grunt Engineer NASA Office of Logic Design

  2. Unprogrammed Antifuse Reliability • Unprogrammed antifuses (millions/device) must remain high impedance • Potential Failure Mechanisms • Time Dependent Dielectric Breakdown • Heavy Ion Induced Rupture • A Failure Results in Unintended Connection • Short to power • Short to ground • Bridging short • NASA tests at BNL (April and November 2004)

  3. Test Program Elements - Devices

  4. Test Program Elements – Devices Cross Section

  5. Test Program Elements – Radiation Test Fixture

  6. Test Program Elements – Heavy Ion Test B C A

  7. RTSX-SU Orientation in Chamber Physical orientation of the K-Latch based R-Cell. The ion beam is going directly into the screen.

  8. April 2004 BNL Run

  9. Summary of April, 2004 Results • Bromine Testing • No ruptures detected • 0 and 55 • VCCA = 2.75V; VCCI = 5.5V • Iodine Testing • VCCA = 2.75V; VCCI = 5.5V • Ruptures detected at both 0 and 55, more likely at 55 • Lower voltages: rupture not detected • Most runs at minimum voltages for SEE testing • SEU’s Dependence on Frequency, Similar to MEC • Recommendations • Conduct additional voltage margin tests using Bromine • Test with multiple roll and tilt angles.

  10. Nominal Heavy Ion Run

  11. Heavy Ion Rupture Margin Test RTSX72SU Heavy Ion Rupture Test BNL, April 2004 NASA Office of Logic Design Each step represents a rupture event

  12. November 2004 BNL Run

  13. November 2004 Major Test Objectives • Conduct additional voltage margin tests using Bromine • Test with multiple roll and tilt angles. • Test with different patterns • SEE pattern used in April was simple, optimized for SEE evaluation • Added aggressive application-type pattern that utilized close to 100% of the device • Test with multiple lots of RTSX-SU • Test with multiple products • RTSX-SU • A54SX-A/UMC (no peak current limiting resistor) • Add additional runs to increase data base and statistics

  14. Heavy Ion Rupture Margin TestBNL, November 2004 Aggregate Data(Runs with Rupture/Number of Runs) In Specification Out of Specification Includes angles of 0°, ±45°, and ±60°. RTSX32SU and A54SX32A/UMC Devices VCCA(max) = 2.75V NASA Office of Logic Design November 7, 2004 Brookhaven National Labs Note: For Iodine w/ VCCA = 3.0V, three runs had 2 ruptures each and one run had 4 ruptures; all other runs had no more than one rupture.

  15. Heavy Ion Rupture Data: SX-A/UMC and SX-SU Aggregate Data: Runs with Rupture/Number of Runs In Specification Out of Specification NASA Office of Logic Design November 7, 2004 Brookhaven National Labs • Notes: • For Iodine w/ VCCA = 3.0V, ±45°, three runs had 2 ruptures each. • For Iodine w/ VCCA = 3.0V, ±60°, the one run with rupture had 4 ruptures.   The run with 4 ruptures was aborted at a fluence of 4.6 x 106 ions/cm2.

  16. End of rk

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